Udvidet returret til d. 31. januar 2025

Advancements in AI and IoT for Chip Manufacturing and Defect Prevention

Advancements in AI and IoT for Chip Manufacturing and Defect Preventionaf Rupal Jain
Bag om Advancements in AI and IoT for Chip Manufacturing and Defect Prevention

This is essential reading for semiconductor professionals seeking to expand their knowledge on silicon processes, understand defect prevention, and explore optimizing processes by reducing defects using AI and IoT technologies. It charts a course where semiconductor manufacturing defects are minimized and maximizes productivity.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9788770046817
  • Indbinding:
  • Paperback
  • Sideantal:
  • 138
  • Udgivet:
  • 25. november 2024
  • Størrelse:
  • 156x234x0 mm.
  • BLACK WEEK
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Leveringstid: 2-4 uger
Forventet levering: 24. december 2024
Forlænget returret til d. 31. januar 2025

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This is essential reading for semiconductor professionals seeking to expand their knowledge on silicon processes, understand defect prevention, and explore optimizing processes by reducing defects using AI and IoT technologies. It charts a course where semiconductor manufacturing defects are minimized and maximizes productivity.

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