Bøger i Crystals serien

XI. International Congress of Gastroenterology, Symposium Cytostat. Drugs and Radiotherapy in Gastroenterology, Held in Hamburg on June 11, 1980

1.1 The Role of Silicon as a Semiconductor Silicon is unchallenged as a semiconductor base material in our present electronics indu stry. Assuming a maximum percentage of 10% to be replaced by the year 2000 would roughly mean a cumulative annual production of 2 million metric tons of crude silicon (based on present solar cell standards)!).

Lattice defects of organic molecular crystals affect their optical or electrical properties by changing the local energy structure. In addition to the usual geometrical crystallographic defects, chemical defects are important too which originate, for example, from differences in the substitution sites of molecules carrying side groups.

The preparation of this manuscript has been supported by several women whose help is gratefully acknowledged by the autor: Mrs. Gisela Neuner for the type writing, Mrs. Abigail Sanders, Mrs. Fiona Eels and especially Prof.

Springer-Verlag, Berlin Heidelberg, in conjunction with Springer-Verlag New York, is pleased to announce a new series: CRYSTALS Growth, Properties, and Applications The series will present critical reviews of recent developments in the field of crystal growth, properties, and applications.

With contributions by numerous experts

Huber, of Wacker-Chemitronic GmbH - the world's largest producer of silicon-crystals - to write a comprehensive article about the practical and scientific aspects of growing silicon-crystals by the Czochralski method and about silicon wafer manufacture.

Although already valuable information on crystal defects can be gained by using the routine technique of diffraction contrast imagingl-3) which has a resolution of some 4 10 nm - in the special weak-beam technique ) of some nm -, the detection of crystal defects and inhomogeneities, resp.

Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal.

With contributions by numerous experts

Springer-Verlag, Berlin Heidelberg, in conjunction with Springer-Verlag New York, is pleased to announce a new series: CRYSTALS Growth, Properties, and Applications The series presents critical reviews of recent developments in the field of crystal growth, properties, and applications.

Springer-Verlag, Berlin Heidelberg, in conjunction with Springer-Verlag New York, is pleased to announce a new series: CRYSTALS Growth, Properties, and Applications The series presents critical reviews of recent developments in the field of crystal growth, properties, and applications.