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Takes the enterprising researcher, student, or hobbyist through explorations in a variety of computing exercises with the physical sciences. The book has tutorials and exercises for a wide range of scientific computing problems.
After a quarter century of discoveries that rattled the foundations of classical mechanics and electrodynamics, the year 1926 saw the publication of two works intended to provide a theoretical structure to support new quantum explanations of the subatomic world. Heisenberg's matrix mechanics and Schrodinger's wave mechanics provided compatible but mathematically disparate ways of unifying the discoveries of Planck, Einstein, Bohr and many others. Efforts began immediately to prove the equivalence of these two structures, culminated successfully by John von Neumann's 1932 volume "Mathematical Foundations of Quantum Mechanics." This forms the springboard for the current effort. We begin with a presentation of a minimal set of von Neumann postulates while introducing language and notation to facilitate subsequent discussion of quantum calculations based in finite dimensional Hilbert spaces. Chapters which follow address two-state quantum systems (with spin one-half as the primary example), entanglement of multiple two-state systems, quantum angular momentum theory and quantum approaches to statistical mechanics. A concluding chapter gives an overview of issues associated with quantum mechanics in continuous infinite-dimensional Hilbert spaces.
The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.
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