Bøger i Springer Series in Surface Sciences serien

This book provides a comprehensive introduction to a recently-developed approach to the growth mechanism of thin films and nanostructures via chemical vapour deposition (CVD).

This monograph discusses the essential principles of the evaporationprocess by looking at it at the molecular and atomic level.In the first part methods of statistical physics, physical kinetics andnumerical modeling are outlined including the Maxwell's distributionfunction, the Boltzmann kinetic equation, the Vlasov approach, and theCUDA technique.The distribution functions of evaporating particles are then defined.Experimental results on the evaporation coefficient and the temperaturejump on the evaporation surface are critically reviewed and compared tothe theory and numerical results presented in previous chapters.The book ends with a chapter devoted to evaporation in differentprocesses, such as boiling and cavitation.This monograph addressesgraduate students and researchers working on phase transitions andrelated fields.

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors¿ previous volume ¿Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,¿ presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy.

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics.

Experimental advances in helium atom scattering spectroscopy over the last forty years have allowed the measurement of surface phonon dispersion curves of more than 200 different crystal surfaces and overlayers of insulators, semiconductors and metals.

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.

This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides.

This book provides a comprehensive introduction to a recently-developed approach to the growth mechanism of thin films and nanostructures via chemical vapour deposition (CVD).

This book presents the method of ion beam modification of solids in realization, theory and applications in a comprehensive way. Furthermore, general concepts of damage evolution as a function of ion mass, ion fluence, ion flux and temperature are described in detail and their limits and applicability are discussed.

This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.

The book describes the experimental techniques employed to study surfaces and interfaces. Descriptions of real experimental setups, experimental results at different systems are given to show both the strength and the limits of the technique.

In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.

This book gives a representative survey of the state of the art of research on gas-surface interactions. The book presents how modern surface science targets the atomic-level understanding of physical and chemical processes at surfaces, with particular emphasis on dynamical aspects.

This book focuses on a research field that is rapidly emerging as one of the most promising ones for the global optics and photonics community: the ¿lab-on-fiber¿ technology. Inspired by the well-established "lab on-a-chip" concept, this new technology essentially envisages novel and highly functionalized devices completely integrated into a single optical fiber for both communication and sensing applications.Based on the R&D experience of some of the world's leading authorities in the fields of optics, photonics, nanotechnology, and material science, this book provides a broad and accurate description of the main developments and achievements in the lab-on-fiber technology roadmap, also highlighting the new perspectives and challenges to be faced.This book is essential for scientists interested in the cutting-edge fiber optic technology, but also for graduate students.

It outlines contemporary trends in the field covering a wide range of topical areas: atomic structure of surfaces and interfaces, molecular films and polymer adsorption, biologically inspired nanophysics, surface design and pattern formation, and computer modeling of interfacial phenomena.

This book deals with the latest achievements in the field of optical coherent microscopy. The coherent light microscopy reference provided here does not focus on the experimental mechanics of such techniques but instead is meant to provide a users manual to illustrate the strengths and capabilities of developing techniques.

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

This guide to the use of surface analysis techniques, now in its second edition, has expanded to include more techniques, current applications and updated references.

The book describes the experimental techniques employed to study surfaces and interfaces. Descriptions of real experimental setups, experimental results at different systems are given to show both the strength and the limits of the technique.

Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related scanning probe methods.

"Adhesion and Friction: Microscopic Concepts" was the theme of the third workshop on interface phenomena organized jointly by the surface science groups at Dalhousie University and the University of Maine.

The contributions deal with the following subjects: structure of surfaces, surface science and catalysis, two-dimensional physics and phase transitions, scanning tunneling microscopy, surface scattering and surface dynamics, chemical reactions at surfaces, solid-solid interfaces and superlattices, and surface studies with synchrotron radiation.

This volume contains review articles written by the invited speakers at the eighth International Summer Institute in Surface Science (ISISS 1987), held at the University of Wisconsin-Milwaukee in August of 1987.

This book deals with adsorption and catalysis on the surface of transition elements and their compounds, many of which are in teresting because of their particular electronic structure. Consideration is given mostly to simple (as opposed to mixed) oxides of transition elements, to common metals and to the adsorption of simple gases.

These proceedings are the result of the third international workshop on Desorption Induced by Electronic Transitions, DIET III, which took place on Shelter Island, NY, May. 20-22, 1987.

Diffusion in solids and at interfaces is a very active area of research, as the contributions to this volume attest.