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"Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
Suitable for ethics courses in engineering and science, this book focuses on analysing the consequences rather than rules to be obeyed in making decisions. It can be used either in a one-credit-hour semester course or as a set of drop-in modules in a core engineering or science course; and also includes an Instructor's Manual.
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