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Interfacial Compatibility in Microelectronics

- Moving Away from the Trial and Error Approach

af Tomi Laurila, Vesa Vuorinen, Markus Turunen, mfl.

1.634,95 - 1.642,95 kr.

This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
- Bog
- 1.634,95 kr.
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