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A real need exists for ways to bridge the gap between basic research and prac tical application, for faster utilization of new discoveries and new developments in the world of technology, and for technical transfer of defense and space accomplish ments to the civilian economy.
knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world's scientific knowledge.
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis.
At the same time the researcher is faced with problems of in creasing complexity, with the requirement for new knowledge and new techniques, and must frequently, with little time, bridge the gap between his own sphere of experience and a sometimes apparently unrelated new interest.
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