Bøger af Valeria Bertacco

The purpose of this book is to survey the state of the art and evolving directions in post-silicon and runtime verification. They then dive into the presentation of several new post-silicon verification solutions aimed at boosting the verification coverage of modern processors, dedicating several chapters to this topic.

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause of errors directly;

This book is intended as an innovative overview of current formal verification methods, combined with an in-depth analysis of some advanced techniques to improve the scalability of these methods, and close the gap between design and verification in computer-aided design.

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. (2) an RTL error diagnosis method that identifies the root cause of errors directly;