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Over the last quarter of this century, revolutionary advances have been made both in kind and in precision in the application of particle traps to the study of thephysics of charged particles, leading to intensi?ed interest in, and wide proliferation of, this topic.
This second volume of the Charged Particle Traps deals with the rapidly expanding body of research exploiting the electromagnetic con?nement of ions, whose principles and techniques were the subject of volume I.
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