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High Quality Test Pattern Generation and Boolean Satisfiability

Bag om High Quality Test Pattern Generation and Boolean Satisfiability

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781441999757
  • Indbinding:
  • Hardback
  • Sideantal:
  • 193
  • Udgivet:
  • 10. Marts 2011
  • Udgave:
  • 2012
  • Størrelse:
  • 234x156x12 mm.
  • Vægt:
  • 488 g.
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Leveringstid: 2-3 uger
Forventet levering: 23. Oktober 2024

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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

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