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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Bag om Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781783265282
  • Indbinding:
  • Hardback
  • Sideantal:
  • 432
  • Udgivet:
  • 18. maj 2015
  • Udgave:
  • 2
  • Størrelse:
  • 160x238x23 mm.
  • Vægt:
  • 802 g.
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Leveringstid: 2-3 uger
Forventet levering: 20. december 2024
Forlænget returret til d. 31. januar 2025

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Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.

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