Markedets billigste bøger
Gratis fragt fra 599,- kr
Trustpilot
Levering: 1 - 2 hverdage
Hjælp
Login
  1. Forside
  2. Bøger
  3. Business og læring
  4. Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

af Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
Advanced Scanning Electron Microscopy and X-Ray Microanalysis af Patrick Echlin
Bag om Advanced Scanning Electron Microscopy and X-Ray Microanalysis

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9781475790290
  • Indbinding:
  • Paperback
  • Sideantal:
  • 454
  • Udgivet:
  • 8. Juni 2013
  • Udgave:
  • 11986
  • Størrelse:
  • 229x152x24 mm.
  • Vægt:
  • 692 g.
  Gratis fragt
Leveringstid: 2-3 uger
Forventet levering: 7. Juni 2024

Bag om Patrick Echlin

Vis alle bøger af Patrick Echlin

Beskrivelse af Advanced Scanning Electron Microscopy and X-Ray Microanalysis

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

Brugerbedømmelser af Advanced Scanning Electron Microscopy and X-Ray Microanalysis



Andre købte også..
Find lignende bøger
Bogen Advanced Scanning Electron Microscopy and X-Ray Microanalysis findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.