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Cluster Secondary Ion Mass Spectrometry

- Principles and Applications

Bag om Cluster Secondary Ion Mass Spectrometry

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780470886052
  • Indbinding:
  • Hardback
  • Sideantal:
  • 368
  • Udgivet:
  • 28. juni 2013
  • Størrelse:
  • 243x165x21 mm.
  • Vægt:
  • 762 g.
  • BLACK NOVEMBER
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Leveringstid: Ukendt - mangler pt.

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This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.

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