CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 - bogreolen.dk

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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

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Bag om CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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Sprog:
Engelsk

ISBN:
9781107408326

Forlag:
Cambridge University Press

Indbinding:
Paperback

Sideantal:
194

Udgivet:
5. Juni 2014

Størrelse:
152x229x10 mm.

Vægt:
27 g.

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Leveringstid: 2-3 uger

Forventet levering: 26. Oktober 2024

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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