CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 - bogreolen.dk

Markedets billigste bøger

Gratis fragt fra 599,- kr

Levering: 1 - 2 hverdage

CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

Du sparer 0% ift. normalprisen Spar 0%

Hardback
2-3 uger
1.147,95 kr.

Bag om CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Vis mere

Sprog:
Engelsk

ISBN:
9781605111285

Forlag:
Materials Research Society

Indbinding:
Hardback

Sideantal:
194

Udgivet:
19. November 2009

Størrelse:
160x236x14 mm.

Vægt:
430 g.

1.147,95 kr.
~~1.147,95 kr.~~

Gratis fragt

Leveringstid: 2-3 uger

Forventet levering: 26. Oktober 2024

Beskrivelse af CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Brugerbedømmelser af CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155

Andre købte også..

Find lignende bøger

Bogen CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 findes i følgende kategorier:

Business og læring