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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

- Process-Aware SRAM Design and Test

af Andrei Pavlov, Manoj Sachdev

indgår i Frontiers in Electronic Testing serien

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies af Andrei Pavlov
Bag om CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781402083624
  • Indbinding:
  • Hardback
  • Sideantal:
  • 194
  • Udgivet:
  • 1. maj 2008
  • Udgave:
  • 2008
  • Størrelse:
  • 239x166x19 mm.
  • Vægt:
  • 468 g.
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 17. januar 2025

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Beskrivelse af CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

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