Markedets billigste bøger
Gratis fragt fra 599,- kr
Trustpilot
Levering: 1 - 2 hverdage
Hjælp
Login
  1. Forside
  2. Bøger
  3. Business og læring
  4. Computer og IT
  5. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

- Process-Aware SRAM Design and Test

af Andrei Pavlov, Manoj Sachdev

indgår i Frontiers in Electronic Testing serien

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies af Andrei Pavlov
Bag om CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9789048178551
  • Indbinding:
  • Paperback
  • Sideantal:
  • 194
  • Udgivet:
  • 28. oktober 2010
  • Udgave:
  • 12008
  • Størrelse:
  • 234x156x11 mm.
  • Vægt:
  • 332 g.
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 17. januar 2025

Bag om Andrei Pavlov

Vis alle bøger af Andrei Pavlov

Beskrivelse af CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Brugerbedømmelser af CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies



Andre købte også..
Find lignende bøger
Bogen CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.