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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

af Manoj Sachdev, José Pineda de Gyvez

indgår i Frontiers in Electronic Testing serien

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits af Manoj Sachdev
Bag om Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780387465463
  • Indbinding:
  • Hardback
  • Sideantal:
  • 328
  • Udgivet:
  • 4. juni 2007
  • Udgave:
  • 22007
  • Størrelse:
  • 234x156x20 mm.
  • Vægt:
  • 694 g.
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 17. januar 2025

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

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