Udvidet returret til d. 31. januar 2025

Design for AT-Speed Test, Diagnosis and Measurement

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Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780792386698
  • Indbinding:
  • Hardback
  • Sideantal:
  • 239
  • Udgivet:
  • 1. september 1999
  • Udgave:
  • 2000
  • Størrelse:
  • 254x178x15 mm.
  • Vægt:
  • 1570 g.
  • BLACK NOVEMBER
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 20. november 2024

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Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels.

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