Udvidet returret til d. 31. januar 2025

Electromigration Inside Logic Cells

- Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Bag om Electromigration Inside Logic Cells

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783319488981
  • Indbinding:
  • Hardback
  • Sideantal:
  • 118
  • Udgivet:
  • 16. december 2016
  • Udgave:
  • 12017
  • Størrelse:
  • 235x155x10 mm.
  • Vægt:
  • 3376 g.
  • BLACK NOVEMBER
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 21. november 2024

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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.

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