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Electromigration Modeling at Circuit Layout Level

Bag om Electromigration Modeling at Circuit Layout Level

Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9789814451208
  • Indbinding:
  • Paperback
  • Sideantal:
  • 103
  • Udgivet:
  • 4. maj 2013
  • Udgave:
  • 2013
  • Størrelse:
  • 155x235x6 mm.
  • Vægt:
  • 1883 g.
  • BLACK NOVEMBER
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 7. december 2024

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Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.

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