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Evaluation of Advanced Semiconductor Materials by Electron Microscopy

indgår i NATO Science Series B serien

Evaluation of Advanced Semiconductor Materials by Electron Microscopy
Bag om Evaluation of Advanced Semiconductor Materials by Electron Microscopy

With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781461278504
  • Indbinding:
  • Paperback
  • Sideantal:
  • 412
  • Udgivet:
  • 13. oktober 2011
  • Udgave:
  • 11989
  • Størrelse:
  • 244x170x22 mm.
  • Vægt:
  • 734 g.
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 17. januar 2025

Beskrivelse af Evaluation of Advanced Semiconductor Materials by Electron Microscopy

With these developments in mind, an application was made to the NATO Science Committee in late summer 1987 to fund an Advanced Research Work shop to review the electron microscopy of advanced semiconductors.

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