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From Contamination to Defects, Faults and Yield Loss

- Simulation and Applications

af Jitendra B. Khare, Wojciech Maly

indgår i Frontiers in Electronic Testing serien

From Contamination to Defects, Faults and Yield Loss af Jitendra B. Khare
Bag om From Contamination to Defects, Faults and Yield Loss

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780792397144
  • Indbinding:
  • Hardback
  • Sideantal:
  • 150
  • Udgivet:
  • 1. april 1996
  • Udgave:
  • 1996
  • Størrelse:
  • 234x156x11 mm.
  • Vægt:
  • 930 g.
  • BLACK NOVEMBER
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 20. november 2024

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Beskrivelse af From Contamination to Defects, Faults and Yield Loss

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

Brugerbedømmelser af From Contamination to Defects, Faults and Yield Loss



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