Udvidet returret til d. 31. januar 2025

Identification of Defects in Semiconductors

Bag om Identification of Defects in Semiconductors

Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9780127521596
  • Indbinding:
  • Hardback
  • Sideantal:
  • 376
  • Udgivet:
  • 2. juli 1998
  • Størrelse:
  • 152x229x25 mm.
  • Vægt:
  • 800 g.
  • BLACK NOVEMBER
  Gratis fragt
Leveringstid: 2-3 uger
Forventet levering: 11. december 2024

Beskrivelse af Identification of Defects in Semiconductors

Since its inception in 1966, the series of numbered volumes known as "Semiconductors and Semimetals" has distinguished itself through the selection of authors, editors, and contributors. Reflecting the interdisciplinary nature of the field that the series covers, these volumes are aimed at physicists, chemists, materials scientists, and others.

Brugerbedømmelser af Identification of Defects in Semiconductors



Find lignende bøger
Bogen Identification of Defects in Semiconductors findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.