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Integrated Circuit Defect-Sensitivity: Theory and Computational Models

af José Pineda de Gyvez

indgår i The Springer International Series in Engineering and Computer Science serien

Integrated Circuit Defect-Sensitivity: Theory and Computational Models af José Pineda de Gyvez
Bag om Integrated Circuit Defect-Sensitivity: Theory and Computational Models

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780792393061
  • Indbinding:
  • Hardback
  • Sideantal:
  • 167
  • Udgivet:
  • 31. december 1992
  • Udgave:
  • 1993
  • Størrelse:
  • 234x156x12 mm.
  • Vægt:
  • 1000 g.
  • BLACK NOVEMBER
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Leveringstid: 8-11 hverdage
Forventet levering: 7. december 2024

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Beskrivelse af Integrated Circuit Defect-Sensitivity: Theory and Computational Models

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

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