Black November: Store besparelser hele måneden Vi fejrer Black Friday hele november måned med store besparelser
Udvidet returret til d. 31. januar 2025
Hjælp
Login
  1. Forside
  2. Bøger
  3. Business og læring
  4. Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Integrated Circuit Defect-Sensitivity: Theory and Computational Models

af José Pineda de Gyvez

indgår i The Springer International Series in Engineering and Computer Science serien

Integrated Circuit Defect-Sensitivity: Theory and Computational Models af José Pineda de Gyvez
Bag om Integrated Circuit Defect-Sensitivity: Theory and Computational Models

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9781461363835
  • Indbinding:
  • Paperback
  • Sideantal:
  • 167
  • Udgivet:
  • 23. februar 2014
  • Udgave:
  • 11993
  • Størrelse:
  • 235x155x11 mm.
  • Vægt:
  • 308 g.
  • BLACK NOVEMBER
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 7. december 2024

Bag om José Pineda de Gyvez

Vis alle bøger af José Pineda de Gyvez

Beskrivelse af Integrated Circuit Defect-Sensitivity: Theory and Computational Models

The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC's).

Brugerbedømmelser af Integrated Circuit Defect-Sensitivity: Theory and Computational Models



Andre købte også..
Find lignende bøger
Bogen Integrated Circuit Defect-Sensitivity: Theory and Computational Models findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.