Udvidet returret til d. 31. januar 2025

Mathematical Challenges in Electron Microscopy

- Volume 232

Bag om Mathematical Challenges in Electron Microscopy

Mathematical Challenges in Electron Microscopy, Volume 232 of Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters. Each chapter is written by an international board of authors.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780443297861
  • Indbinding:
  • Hardback
  • Udgivet:
  • 25. november 2024
  • BLACK WEEK
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Leveringstid: Ukendt - mangler pt.
Forlænget returret til d. 31. januar 2025

Beskrivelse af Mathematical Challenges in Electron Microscopy

Mathematical Challenges in Electron Microscopy, Volume 232 of Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters. Each chapter is written by an international board of authors.

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