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Metal Impurities in Silicon- and Germanium-Based Technologies

- Origin, Characterization, Control, and Device Impact

Bag om Metal Impurities in Silicon- and Germanium-Based Technologies

material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783319939247
  • Indbinding:
  • Hardback
  • Sideantal:
  • 438
  • Udgivet:
  • 22. august 2018
  • Udgave:
  • 12018
  • Størrelse:
  • 155x235x0 mm.
  • Vægt:
  • 869 g.
  • BLACK WEEK
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 10. december 2024

Beskrivelse af Metal Impurities in Silicon- and Germanium-Based Technologies

material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

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