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Microscopy of Semiconducting Materials

- Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Bag om Microscopy of Semiconducting Materials

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642068706
  • Indbinding:
  • Paperback
  • Sideantal:
  • 540
  • Udgivet:
  • 19. oktober 2010
  • Udgave:
  • 12005
  • Størrelse:
  • 234x156x28 mm.
  • Vægt:
  • 1442 g.
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Leveringstid: 8-11 hverdage
Forventet levering: 16. december 2024
Forlænget returret til d. 31. januar 2025

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The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

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