Udvidet returret til d. 31. januar 2025

Noncontact Atomic Force Microscopy

- Volume 2

Bag om Noncontact Atomic Force Microscopy

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution;

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642260704
  • Indbinding:
  • Paperback
  • Sideantal:
  • 401
  • Udgivet:
  • 25. februar 2012
  • Udgave:
  • 2009
  • Størrelse:
  • 157x234x31 mm.
  • Vægt:
  • 646 g.
  • BLACK NOVEMBER
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 7. december 2024

Beskrivelse af Noncontact Atomic Force Microscopy

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution;

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