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Power-Constrained Testing of VLSI Circuits

- A Guide to the IEEE 1149.4 Test Standard

af Nicola Nicolici, Bashir M. Al-Hashimi

indgår i Frontiers in Electronic Testing serien

Power-Constrained Testing of VLSI Circuits af Nicola Nicolici
Bag om Power-Constrained Testing of VLSI Circuits

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781402072352
  • Indbinding:
  • Hardback
  • Sideantal:
  • 178
  • Udgivet:
  • 28. februar 2003
  • Udgave:
  • 2003
  • Størrelse:
  • 297x210x12 mm.
  • Vægt:
  • 990 g.
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 17. januar 2025

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This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

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