Udvidet returret til d. 31. januar 2025

Scanning Electron Microscopy and X-Ray Microanalysis

- Third Edition

Bag om Scanning Electron Microscopy and X-Ray Microanalysis

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781461349693
  • Indbinding:
  • Paperback
  • Sideantal:
  • 689
  • Udgivet:
  • 31. maj 2013
  • Udgave:
  • 320033
  • Størrelse:
  • 182x255x43 mm.
  • Vægt:
  • 1310 g.
  • BLACK NOVEMBER
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Leveringstid: 8-11 hverdage
Forventet levering: 21. november 2024

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

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