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Scanning Electron Microscopy

- Physics of Image Formation and Microanalysis

Bag om Scanning Electron Microscopy

The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783540639763
  • Indbinding:
  • Hardback
  • Sideantal:
  • 529
  • Udgivet:
  • 17. september 1998
  • Udgave:
  • 21998
  • Størrelse:
  • 242x166x34 mm.
  • Vægt:
  • 954 g.
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Leveringstid: 2-4 uger
Forventet levering: 29. april 2025

Beskrivelse af Scanning Electron Microscopy

The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Brugerbedømmelser af Scanning Electron Microscopy



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