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Semiconductor Material and Device Characterization

af Dieter K. (Arizona State University) Schroder

indgår i Wiley - IEEE serien

indgår i IEEE Press serien

Semiconductor Material and Device Characterization af Dieter K. (Arizona State University) Schroder
Bag om Semiconductor Material and Device Characterization

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780471739067
  • Indbinding:
  • Hardback
  • Sideantal:
  • 800
  • Udgivet:
  • 17. februar 2006
  • Udgave:
  • 3
  • Størrelse:
  • 243x164x51 mm.
  • Vægt:
  • 1324 g.
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Beskrivelse af Semiconductor Material and Device Characterization

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.

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