Udvidet returret til d. 31. januar 2025

Spectroscopic Ellipsometry for Photovoltaics

- Volume 1: Fundamental Principles and Solar Cell Characterization

Bag om Spectroscopic Ellipsometry for Photovoltaics

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783319753751
  • Indbinding:
  • Hardback
  • Sideantal:
  • 594
  • Udgivet:
  • 24. januar 2019
  • Udgave:
  • 12018
  • Størrelse:
  • 165x243x36 mm.
  • Vægt:
  • 1058 g.
  • BLACK NOVEMBER
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Leveringstid: 8-11 hverdage
Forventet levering: 6. december 2024

Beskrivelse af Spectroscopic Ellipsometry for Photovoltaics

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

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