Bag om The Stanford Revision and Extension of the Binet-Simon Scale for Measuring Intelligence
This book presents an updated version of the Binet-Simon scale for measuring intelligence, developed by Lewis Madison Terman at Stanford University. It includes detailed instructions on how to administer and score the test, as well as normative data for various age groups. This scale has become widely used in the field of psychology and has greatly influenced the modern conception of intelligence.
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