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VLSI Design and Test

- 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Bag om VLSI Design and Test

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642420238
  • Indbinding:
  • Paperback
  • Sideantal:
  • 388
  • Udgivet:
  • 16. november 2013
  • Udgave:
  • 2013
  • Størrelse:
  • 235x155x21 mm.
  • Vægt:
  • 6088 g.
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 16. december 2024
Forlænget returret til d. 31. januar 2025

Beskrivelse af VLSI Design and Test

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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