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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

af Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
Advanced Scanning Electron Microscopy and X-Ray Microanalysis af Patrick Echlin
Bag om Advanced Scanning Electron Microscopy and X-Ray Microanalysis

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780306421402
  • Indbinding:
  • Hardback
  • Sideantal:
  • 454
  • Udgivet:
  • 1. marts 1986
  • Udgave:
  • 1986
  • Størrelse:
  • 234x156x27 mm.
  • Vægt:
  • 1880 g.
  • BLACK NOVEMBER
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Beskrivelse af Advanced Scanning Electron Microscopy and X-Ray Microanalysis

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.

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