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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

- A User-Oriented Guide

Bag om Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642273803
  • Indbinding:
  • Hardback
  • Sideantal:
  • 528
  • Udgivet:
  • 25. Oktober 2012
  • Udgave:
  • 2013
  • Størrelse:
  • 161x241x34 mm.
  • Vægt:
  • 940 g.
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 11. Oktober 2024

Beskrivelse af Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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