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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

- A User-Oriented Guide

Bag om Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642431739
  • Indbinding:
  • Paperback
  • Sideantal:
  • 528
  • Udgivet:
  • 15. november 2010
  • Udgave:
  • 2013
  • Størrelse:
  • 154x234x38 mm.
  • Vægt:
  • 814 g.
  • BLACK NOVEMBER
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 29. november 2024

Beskrivelse af Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.

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