Udvidet returret til d. 31. januar 2025

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Bag om Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9780387857305
  • Indbinding:
  • Hardback
  • Sideantal:
  • 332
  • Udgivet:
  • 19. marts 2009
  • Udgave:
  • 2009
  • Størrelse:
  • 268x186x23 mm.
  • Vægt:
  • 872 g.
  • BLACK WEEK
  Gratis fragt
Leveringstid: 8-11 hverdage
Forventet levering: 13. december 2024
Forlænget returret til d. 31. januar 2025

Beskrivelse af Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Brugerbedømmelser af Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis



Find lignende bøger
Bogen Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.