Name: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Price: 1305.95 DKK
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Author: Patrick Echlin
ISBN: 9781441946744

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis af Patrick Echlin

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The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

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Sprog:
Engelsk

ISBN:
9781441946744

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
332

Udgivet:
12. oktober 2010

Udgave:
12009

Størrelse:
254x178x18 mm.

Vægt:
655 g.

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Leveringstid: 2-3 uger

Forventet levering: 26. november 2024

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The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

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Brugerbedømmelser af Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

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