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High Quality Test Pattern Generation and Boolean Satisfiability

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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781489988478
  • Indbinding:
  • Paperback
  • Sideantal:
  • 193
  • Udgivet:
  • 20. oktober 2014
  • Udgave:
  • 2012
  • Størrelse:
  • 235x155x11 mm.
  • Vægt:
  • 332 g.
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Leveringstid: 8-11 hverdage
Forventet levering: 16. januar 2025

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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

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